January 21, 2021
WALTHAM, Massachusetts – The Vanta iX in-line X-ray fluorescence (XRF) analyzer automates material analysis and alloy ID on the manufacturing line, delivering instant results for real-time process monitoring and 100% inspection. Designed to operate 24/7, the analyzer streamlines quality inspections for metal fabrication.
Metal fabrication requires 24/7 process control to verify that products are being manufactured using the correct alloy to avoid costly material mix-ups. The Vanta iX analyzer provides clear material and grade ID in seconds, so metal fabricators can demonstrate that their products are 100% tested and verified. The instrument can deliver pass/fail results or full material chemistry.
With a silicon drift detector (SDD) and Olympus’ Axon Technology, the analyzer can test a wide range of alloy and metal grades – including light elements. It brings the same high-count rate and stability as the rest of the Vanta series.
The Vanta iX analyzer is easy to install in manufacturing environments – use the mounting holes on each side to mount the analyzer onto robotics and other systems.
Easily control the analyzer with either the Vanta Connect API or a PLC and discrete wire. Connector options include Ethernet (RJ-45) for Power over Ethernet, USB, Discrete I/O (16 pins), and AUX DC power.
Built to endure the high levels of vibration, electromagnetic and acoustical noise, dust and moisture of production facilities, the analyzer is vibration tested (MIL-STD-810G), IP54 rated, and designed to operate from -10°C to 50°C (14°F to 122°F) with continuous testing. A built-in heat sink lowers the internal temperature, while fan attachment points are available if extra cooling is needed. The analyzer offers toolless window changes for fast maintenance.